At the Weizmann Institute of Science – Schmidt Hall
Characterization techniques and exploitation of data in surface and thin film analysis
| Time: | Lecturer: | Topic: |
|---|---|---|
| 08:30-09:00 | Gathering and registration | |
| 09:00-10:30 | Amy V. Walker, UT Dallas, USA | A New Materials Toolkit: Acquiring and Processing Data Using Multi-Technique Approaches Part I |
| 10:30-11:00 | Coffee break | |
| 11:00-11:45 | Hagai Cohen, WIS | Electron Spectroscopies as Characterization Tools of Surfaces and Thin Film Heterostructures |
| 11:45-12:30 | Ilan Goldfarb, TAU | Analysis of linear defects at single-crystal surfaces by elastic and diffuse scattering in electron diffraction |
| 12:30-13:45 | Lunch | |
| 13:45-14:30 | Yaron Paz, Technion | Transient phenomena in photocatalysis, as studied by ultrafast FTIR measurements |
| 14:30-15:15 | Adrian Cernescu, neaspec GmbH, Munich, Germany | Imaging and Spectroscopy at 10nm Spatial Resolution using s-SNOM |